Scientists Discover Dual-Effect Gene for Disease Resistance and Early Maturity in Wheat
【Tech 24H】The Chinese Academy of Agricultural Sciences identified a key gene, TaFAH, which acts as a "dual-effect switch" for disease resistance and early maturation in wheat. Enhancing TaFAH expression significantly suppresses Fusarium graminearum infection and advances the heading period by about 10 days. This discovery provides crucial genetic resources for breeding disease-resistant wheat varieties.
Editor:Zhang Liyan